ISTFA 2015
10/03/2015
Digit Concept will attend the 41st International Symposium for Testing and Failure Analysis, that will take place in Portland (Oregon, USA) 1-5 November 1-5, 2015.
All the DC Team we will be gald to meet you at our Booth 337 and to show you our last products.
Don’t miss our presentation during the session « Sample Preparation and Device Deprocessing II », Thursday, November 5, 2015 at 12:40 PM, titled: LASER combined with Plasma will it be the future green and safe ICs decapsulation method?